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[IEEE 2004 IEEE International Reliability Physics Symposium. - Phoenix, AZ, USA (25-29 April 2004)] 2004 IEEE International Reliability Physics Symposium. Proceedings - Reliability evaluation and comparison of Class-E and Class-A power amplifiers with 0.18 μm CMOS technology

✍ Scribed by Wei-Cheng Lin, ; Long-Jei Du, ; Ya-Chin King,

Book ID: 127356606
Publisher: IEEE
Year: 2004
Weight: 143 KB
Category: Article
ISBN-13: 9780780383159
DOI: 10.1109/relphy.2004.1315362

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