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[IEEE 1997 IEEE International Integrated Reliability Workshop Final Report - Lake Tahoe, CA, USA (13-16 Oct. 1997)] 1997 IEEE International Integrated Reliability Workshop Final Report (Cat. No.97TH8319) - Correlation of charge-to-breakdown obtained from constant current stresses and ramped current stresses, and the implications for ultra-thin gate oxides

✍ Scribed by Dumin, N.A.

Book ID: 126757460
Publisher: IEEE
Year: 1997
Weight: 533 KB
Category: Article
ISBN-13: 9780780342057
DOI: 10.1109/IRWS.1997.660288

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