𝔖 Bobbio Scriptorium

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[IEEE 1997 IEEE International Integrated Reliability Workshop Final Report - Lake Tahoe, CA, USA (13-16 Oct. 1997)] 1997 IEEE International Integrated Reliability Workshop Final Report (Cat. No.97TH8319) - A new algorithm for circuit-level electrothermal simulation under EOS/ESD stress

✍ Scribed by Li, T.; Tsai, C.H.; Huh, Y.J.; Rosenbaum, E.; Kang, S.M.

Book ID: 126708611
Publisher: IEEE
Year: 1997
Weight: 184 KB
Category: Article
ISBN-13: 9780780342057
DOI: 10.1109/IRWS.1997.660305

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