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[IEEE 2000 IEEE International Integrated Reliability Workshop Final Report - Lake Tahoe, CA, USA (23-26 Oct. 2000)] 2000 IEEE International Integrated Reliability Workshop Final Report (Cat. No.00TH8515) - Developing aged SPICE model for hot carrier reliability simulation

✍ Scribed by Qiuyi Ye, ; Terletzki, H.; Tonti, W.

Book ID: 126667866
Publisher: IEEE
Year: 2000
Weight: 197 KB
Category: Article
ISBN-13: 9780780363922
DOI: 10.1109/IRWS.2000.911926

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