𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE 2000 IEEE International Integrated Reliability Workshop Final Report - Lake Tahoe, CA, USA (23-26 Oct. 2000)] 2000 IEEE International Integrated Reliability Workshop Final Report (Cat. No.00TH8515) - Reliability studies on sub 100 nm SOI-MNSFETs

✍ Scribed by Mahapatra, S.; Ramgopal Rao, V.; Vasi, J.; Cheng, B.; Woo, J.C.S.

Book ID: 126594731
Publisher: IEEE
Year: 2000
Tongue: English
Weight: 265 KB
Category: Article
ISBN-13: 9780780363922
DOI: 10.1109/IRWS.2000.911895

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE 2000 IEEE International Integrated

[IEEE 2000 IEEE International Integrated Reliability Workshop Final Report - Lake Tahoe, CA, USA (23-26 Oct. 2000)] 2000 IEEE International Integrated Reliability Workshop Final Report (Cat. No.00TH8515) - Developing aged SPICE model for hot carrier reliability simulation

✍ Qiuyi Ye, ; Terletzki, H.; Tonti, W. 📂 Article 📅 2000 🏛 IEEE ⚖ 197 KB

[IEEE 2000 IEEE International Integrated

[IEEE 2000 IEEE International Integrated Reliability Workshop Final Report - Lake Tahoe, CA, USA (23-26 Oct. 2000)] 2000 IEEE International Integrated Reliability Workshop Final Report (Cat. No.00TH8515) - On the methodology of assessing hot-carrier reliability of analog circuits

✍ Le, H.; Marcoux, P.J.; Jiang, W.; Chung, J.E. 📂 Article 📅 2000 🏛 IEEE ⚖ 340 KB

[IEEE 2000 IEEE International Integrated

[IEEE 2000 IEEE International Integrated Reliability Workshop Final Report - Lake Tahoe, CA, USA (23-26 Oct. 2000)] 2000 IEEE International Integrated Reliability Workshop Final Report (Cat. No.00TH8515) - Method for the extraction of extrinsic data for oxide quality assessment

✍ Martin, A.; Diestel, G. 📂 Article 📅 2000 🏛 IEEE 🌐 English ⚖ 219 KB

[IEEE 2000 IEEE International Integrated

[IEEE 2000 IEEE International Integrated Reliability Workshop Final Report - Lake Tahoe, CA, USA (23-26 Oct. 2000)] 2000 IEEE International Integrated Reliability Workshop Final Report (Cat. No.00TH8515) - Quasi-breakdown in ultra-thin oxides: some insights on the physical mechanisms

✍ Bruyere, S.; Roy, D.; Vincent, E.; Ghibaudo, G. 📂 Article 📅 2000 🏛 IEEE ⚖ 521 KB

[IEEE 2000 IEEE International Integrated

[IEEE 2000 IEEE International Integrated Reliability Workshop Final Report - Lake Tahoe, CA, USA (23-26 Oct. 2000)] 2000 IEEE International Integrated Reliability Workshop Final Report (Cat. No.00TH8515) - The different gate oxide degradation mechanism under constant voltage/current stress and ramp voltage stress

✍ Hongwei Luo, ; Yunfei En, ; Xuedong Kong, ; Xiaoming Zhang, 📂 Article 📅 2000 🏛 IEEE ⚖ 222 KB

[IEEE 1997 IEEE International Integrated

[IEEE 1997 IEEE International Integrated Reliability Workshop Final Report - Lake Tahoe, CA, USA (13-16 Oct. 1997)] 1997 IEEE International Integrated Reliability Workshop Final Report (Cat. No.97TH8319) - Discussion Group Summary Reliability Test Structures

✍ Turner, T. 📂 Article 📅 1997 🏛 IEEE ⚖ 103 KB