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[IEEE 2000 IEEE International Integrated Reliability Workshop Final Report - Lake Tahoe, CA, USA (23-26 Oct. 2000)] 2000 IEEE International Integrated Reliability Workshop Final Report (Cat. No.00TH8515) - Quasi-breakdown in ultra-thin oxides: some insights on the physical mechanisms

✍ Scribed by Bruyere, S.; Roy, D.; Vincent, E.; Ghibaudo, G.

Book ID: 126727626
Publisher: IEEE
Year: 2000
Weight: 521 KB
Category: Article
ISBN-13: 9780780363922
DOI: 10.1109/IRWS.2000.911898

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