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[IEEE 1998 IEEE International Integrated Reliability Workshop Final Report - Lake Tahoe, CA, USA (12-15 Oct. 1998)] 1998 IEEE International Integrated Reliability Workshop Final Report (Cat. No.98TH8363) - Practical triggering of early breakdowns in thin oxides

✍ Scribed by Jackson, J.C.; Dumin, D.J.; Messick, C.; Bendall, R.E.

Book ID: 126722386
Publisher: IEEE
Year: 1998
Weight: 627 KB
Category: Article
ISBN-13: 9780780348813
DOI: 10.1109/IRWS.1998.745363

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