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[IEEE 1998 IEEE International Integrated Reliability Workshop Final Report - Lake Tahoe, CA, USA (12-15 Oct. 1998)] 1998 IEEE International Integrated Reliability Workshop Final Report (Cat. No.98TH8363) - A constant gate current technique for obtaining low-frequency C-V characteristics of MOS capacitors

✍ Scribed by Qian, J.G.; Hensley, R.A.; Littefield, E.

Book ID: 124098571
Publisher: IEEE
Year: 1998
Weight: 379 KB
Category: Article
ISBN-13: 9780780348813
DOI: 10.1109/IRWS.1998.745365

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