𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE 1999 IEEE International Integrated Reliability Workshop Final Report - Lake Tahoe, CA, USA (18-21 Oct. 1999)] 1999 IEEE International Integrated Reliability Workshop Final Report (Cat. No. 99TH8460) - Breakdown voltage distribution and extrinsic TDDB failures of MOS gate oxides

✍ Scribed by Katto, H.

Book ID: 126765394
Publisher: IEEE
Year: 1999
Weight: 520 KB
Edition: 1999
Category: Article
ISBN-13: 9780780356498
DOI: 10.1109/IRWS.1999.830564

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE 1999 IEEE International Integrated

[IEEE 1999 IEEE International Integrated Reliability Workshop Final Report - Lake Tahoe, CA, USA (18-21 Oct. 1999)] 1999 IEEE International Integrated Reliability Workshop Final Report (Cat. No. 99TH8460) - Modeling of polycrystalline silicon thermal coefficient of resistance

✍ Kumar, S.; Bouknight, L. 📂 Article 📅 1999 🏛 IEEE ⚖ 267 KB

[IEEE 1999 IEEE International Integrated

[IEEE 1999 IEEE International Integrated Reliability Workshop Final Report - Lake Tahoe, CA, USA (18-21 Oct. 1999)] 1999 IEEE International Integrated Reliability Workshop Final Report (Cat. No. 99TH8460) - A methodology to assess the influence of Burn In related to long-term reliability of submicron CMOS transistors

✍ Holzhauser, S.; Narr, A. 📂 Article 📅 1999 🏛 IEEE ⚖ 354 KB

[IEEE IEEE International Integrated Reli

[IEEE IEEE International Integrated Reliability Workshop Final Report, 2004 - S. Lake Tahoe, CA, USA (Oct. 18-21, 2004)] IEEE International Integrated Reliability Workshop Final Report, 2004 - Procedure for quantitative fWLR monitoring of gate dielectric reliability

✍ Vollertsen, R. 📂 Article 📅 2004 🏛 IEEE ⚖ 281 KB

[IEEE 1998 IEEE International Integrated

[IEEE 1998 IEEE International Integrated Reliability Workshop Final Report - Lake Tahoe, CA, USA (12-15 Oct. 1998)] 1998 IEEE International Integrated Reliability Workshop Final Report (Cat. No.98TH8363) - Practical triggering of early breakdowns in thin oxides

✍ Jackson, J.C.; Dumin, D.J.; Messick, C.; Bendall, R.E. 📂 Article 📅 1998 🏛 IEEE ⚖ 627 KB

[IEEE 1997 IEEE International Integrated

[IEEE 1997 IEEE International Integrated Reliability Workshop Final Report - Lake Tahoe, CA, USA (13-16 Oct. 1997)] 1997 IEEE International Integrated Reliability Workshop Final Report (Cat. No.97TH8319) - Charge-to-breakdown and trap generation process in thin oxides

✍ Bersuker, G.; Werking, J.; Chan, D.Y. 📂 Article 📅 1997 🏛 IEEE ⚖ 477 KB

[IEEE 2000 IEEE International Integrated

[IEEE 2000 IEEE International Integrated Reliability Workshop Final Report - Lake Tahoe, CA, USA (23-26 Oct. 2000)] 2000 IEEE International Integrated Reliability Workshop Final Report (Cat. No.00TH8515) - Method for the extraction of extrinsic data for oxide quality assessment

✍ Martin, A.; Diestel, G. 📂 Article 📅 2000 🏛 IEEE 🌐 English ⚖ 219 KB