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[IEEE 1999 IEEE International Integrated Reliability Workshop Final Report - Lake Tahoe, CA, USA (18-21 Oct. 1999)] 1999 IEEE International Integrated Reliability Workshop Final Report (Cat. No. 99TH8460) - Modeling of polycrystalline silicon thermal coefficient of resistance

✍ Scribed by Kumar, S.; Bouknight, L.

Book ID: 126681083
Publisher: IEEE
Year: 1999
Weight: 267 KB
Category: Article
ISBN-13: 9780780356498
DOI: 10.1109/IRWS.1999.830583

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