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[IEEE IEEE International Integrated Reliability Workshop Final Report, 2004 - S. Lake Tahoe, CA, USA (Oct. 18-21, 2004)] IEEE International Integrated Reliability Workshop Final Report, 2004 - Atomic scale defects involved in NBTI

✍ Scribed by Campbell, J.P.; Lenahan, P.M.; Krishnan, A.T.; Krishnan, S.

Book ID: 121476857
Publisher: IEEE
Year: 2004
Weight: 229 KB
Category: Article
ISBN-13: 9780780385177
DOI: 10.1109/IRWS.2004.1422752

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