𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE IEEE International Integrated Reliability Workshop Final Report, 2004 - S. Lake Tahoe, CA, USA (Oct. 18-21, 2004)] IEEE International Integrated Reliability Workshop Final Report, 2004 - Fast wafer level data acquisition for reliability characterization of sub-100 nm CMOS technologies

✍ Scribed by Kerber, A.; Kerber, M.

Book ID: 121410226
Publisher: IEEE
Year: 2004
Weight: 284 KB
Category: Article
ISBN-13: 9780780385177
DOI: 10.1109/IRWS.2004.1422736

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE IEEE International Integrated Reli

[IEEE IEEE International Integrated Reliability Workshop Final Report, 2004 - S. Lake Tahoe, CA, USA (Oct. 18-21, 2004)] IEEE International Integrated Reliability Workshop Final Report, 2004 - Atomic scale defects involved in NBTI

✍ Campbell, J.P.; Lenahan, P.M.; Krishnan, A.T.; Krishnan, S. 📂 Article 📅 2004 🏛 IEEE ⚖ 229 KB

[IEEE IEEE International Integrated Reli

[IEEE IEEE International Integrated Reliability Workshop Final Report, 2004 - S. Lake Tahoe, CA, USA (Oct. 18-21, 2004)] IEEE International Integrated Reliability Workshop Final Report, 2004 - Procedure for quantitative fWLR monitoring of gate dielectric reliability

✍ Vollertsen, R. 📂 Article 📅 2004 🏛 IEEE ⚖ 281 KB

[IEEE IEEE International Integrated Reli

[IEEE IEEE International Integrated Reliability Workshop Final Report, 2004 - S. Lake Tahoe, CA, USA (Oct. 18-21, 2004)] IEEE International Integrated Reliability Workshop Final Report, 2004 - Modeling interconnect behavior with a calibrated fem model

✍ Strong, A.; Fen Chen, 📂 Article 📅 2004 🏛 IEEE ⚖ 436 KB

[IEEE 2000 IEEE International Integrated

[IEEE 2000 IEEE International Integrated Reliability Workshop Final Report - Lake Tahoe, CA, USA (23-26 Oct. 2000)] 2000 IEEE International Integrated Reliability Workshop Final Report (Cat. No.00TH8515) - Reliability studies on sub 100 nm SOI-MNSFETs

✍ Mahapatra, S.; Ramgopal Rao, V.; Vasi, J.; Cheng, B.; Woo, J.C.S. 📂 Article 📅 2000 🏛 IEEE 🌐 English ⚖ 265 KB

[IEEE 1999 IEEE International Integrated

[IEEE 1999 IEEE International Integrated Reliability Workshop Final Report - Lake Tahoe, CA, USA (18-21 Oct. 1999)] 1999 IEEE International Integrated Reliability Workshop Final Report (Cat. No. 99TH8460) - Modeling of polycrystalline silicon thermal coefficient of resistance

✍ Kumar, S.; Bouknight, L. 📂 Article 📅 1999 🏛 IEEE ⚖ 267 KB

[IEEE IEEE International Integrated Reli

[IEEE IEEE International Integrated Reliability Workshop, 1996. - Lake Tahoe, CA, USA (Oct. 20-23, 1996)] 1996 International Integrated Reliability Workshop Final Report - BIR-breaking down the barriers [building in reliability methodology for CMOS wafer fab]

✍ Molyneaux, J.; Finucane, N.; Prendergast, J.; Houlihan, S. 📂 Article 📅 1996 🏛 IEEE ⚖ 456 KB