𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE IEEE International Integrated Reliability Workshop, 1996. - Lake Tahoe, CA, USA (Oct. 20-23, 1996)] 1996 International Integrated Reliability Workshop Final Report - BIR-breaking down the barriers [building in reliability methodology for CMOS wafer fab]

✍ Scribed by Molyneaux, J.; Finucane, N.; Prendergast, J.; Houlihan, S.

Book ID: 121379600
Publisher: IEEE
Year: 1996
Weight: 456 KB
Category: Article
ISBN-13: 9780780335981
DOI: 10.1109/IRWS.1996.583376

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