𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE IEEE International Integrated Reliability Workshop, 1996. - Lake Tahoe, CA, USA (Oct. 20-23, 1996)] 1996 International Integrated Reliability Workshop Final Report - Thickness and temperature effects on TDDB for DC and dynamic stressing of thin oxide

✍ Scribed by Soh, S.-H.; Naidu, M.; Hwu, J.; Sadwick, L.

Book ID: 111954383
Publisher: IEEE
Year: 1996
Weight: 449 KB
Volume: 0
Category: Article
ISBN-13: 9780780335981
DOI: 10.1109/irws.1996.583400

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE IEEE International Integrated Reli

[IEEE IEEE International Integrated Reliability Workshop, 1996. - Lake Tahoe, CA, USA (Oct. 20-23, 1996)] 1996 International Integrated Reliability Workshop Final Report - BIR-breaking down the barriers [building in reliability methodology for CMOS wafer fab]

✍ Molyneaux, J.; Finucane, N.; Prendergast, J.; Houlihan, S. 📂 Article 📅 1996 🏛 IEEE ⚖ 456 KB

[IEEE 2003 IEEE International Integrated

[IEEE 2003 IEEE International Integrated Reliability Workshop Final Report - Lake Tahoe, CA, USA (20-23 Oct. 2003)] IEEE International Integrated Reliability Workshop Final Report, 2003 - Stress testing and characterization of high-k dielectric thin films

✍ Luo, W.; Sunardi, D.; Kuo, Y.; Kuo, W. 📂 Article 📅 2003 🏛 IEEE 🌐 English ⚖ 428 KB

[IEEE 2003 IEEE International Integrated

[IEEE 2003 IEEE International Integrated Reliability Workshop Final Report - Lake Tahoe, CA, USA (20-23 Oct. 2003)] IEEE International Integrated Reliability Workshop Final Report, 2003 - Effect of reverse measurement on the HC instability evaluation of MOSFETs

✍ Katto, H. 📂 Article 📅 2003 🏛 IEEE ⚖ 256 KB

[IEEE 2003 IEEE International Integrated

[IEEE 2003 IEEE International Integrated Reliability Workshop Final Report - Lake Tahoe, CA, USA (20-23 Oct. 2003)] IEEE International Integrated Reliability Workshop Final Report, 2003 - DC and AC hot-carrier characteristics of partially depleted SOI MOSFETS with ultra-thin gate dielectrics

✍ Zhao, E.; Chan, J.; Zhang, J.; Marathe, A.; Taylor, K. 📂 Article 📅 2003 🏛 IEEE 🌐 English ⚖ 184 KB

[IEEE 2003 IEEE International Integrated

[IEEE 2003 IEEE International Integrated Reliability Workshop Final Report - Lake Tahoe, CA, USA (20-23 Oct. 2003)] IEEE International Integrated Reliability Workshop Final Report, 2003 - Similarity of pre-breakdown leakage current fluctuations of p- and n-MOSFETs

✍ Reiner, J.C. 📂 Article 📅 2003 🏛 IEEE 🌐 English ⚖ 167 KB

[IEEE 1999 IEEE International Integrated

[IEEE 1999 IEEE International Integrated Reliability Workshop Final Report - Lake Tahoe, CA, USA (18-21 Oct. 1999)] 1999 IEEE International Integrated Reliability Workshop Final Report (Cat. No. 99TH8460) - Breakdown voltage distribution and extrinsic TDDB failures of MOS gate oxides

✍ Katto, H. 📂 Article 📅 1999 🏛 IEEE ⚖ 520 KB