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[IEEE 1997 IEEE International Integrated Reliability Workshop Final Report - Lake Tahoe, CA, USA (13-16 Oct. 1997)] 1997 IEEE International Integrated Reliability Workshop Final Report (Cat. No.97TH8319) - Charge-to-breakdown and trap generation process in thin oxides

✍ Scribed by Bersuker, G.; Werking, J.; Chan, D.Y.

Book ID: 126750705
Publisher: IEEE
Year: 1997
Weight: 477 KB
Category: Article
ISBN-13: 9780780342057
DOI: 10.1109/IRWS.1997.660284

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