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[IEEE 1997 IEEE International Integrated Reliability Workshop Final Report - Lake Tahoe, CA, USA (13-16 Oct. 1997)] 1997 IEEE International Integrated Reliability Workshop Final Report (Cat. No.97TH8319) - A new technique to extract TDDB acceleration parameters from fast Q/sub bd/ tests

✍ Scribed by Chen, Y.; Suehle, J.S.; Shen, B.; Bernstein, J.; Messick, C.; Chaparala, P.

Book ID: 126614399
Publisher: IEEE
Year: 1997
Weight: 278 KB
Category: Article
ISBN-13: 9780780342057
DOI: 10.1109/IRWS.1997.660287

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