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Photoassisted high-frequency capacitance-voltage characterization of the Si[sub 3]N[sub 4]/GaN interface

✍ Scribed by Swenson, B. L.; Mishra, U. K.

Book ID: 121699251
Publisher: American Institute of Physics
Year: 2009
Tongue: English
Weight: 741 KB
Volume: 106
Category: Article
ISSN: 0021-8979
DOI: 10.1063/1.3224852

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