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Study of Reactive Ion Etching of the Si[sub 3]N[sub 4]∕GaAs Interface in CF[sub 4] Plasmas by X-Ray Photoelectron Spectroscopy and X-Ray Photoelectron Diffraction

✍ Scribed by Alnot, P.


Book ID
125491161
Publisher
The Electrochemical Society
Year
1989
Tongue
English
Weight
759 KB
Volume
136
Category
Article
ISSN
0013-4651

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