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on-State Hot Carrier Degradation in Drain-Extended NMOS Transistors

✍ Scribed by Varghese, D.; Moens, P.; Alam, M.A.

Book ID: 114620132
Publisher: IEEE
Year: 2010
Tongue: English
Weight: 908 KB
Volume: 57
Category: Article
ISSN: 0018-9383
DOI: 10.1109/ted.2010.2059632

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