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Effects of the in-situ drain doping on hot-carrier degradation in polysilicon thin film transistors

✍ Scribed by L. Pichon; F. Raoult; T. Mohamed-Brahim; O. Bonnaud; H. Sehil


Publisher
Elsevier Science
Year
1996
Tongue
English
Weight
485 KB
Volume
39
Category
Article
ISSN
0038-1101

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