✦ LIBER ✦
off-State Degradation in Drain-Extended NMOS Transistors: Interface Damage and Correlation to Dielectric Breakdown
✍ Scribed by Varghese, D.; Kufluoglu, H.; Reddy, V.; Shichijo, H.; Mosher, D.; Krishnan, S.; Muhammad Ashraful Alam
- Book ID
- 114618919
- Publisher
- IEEE
- Year
- 2007
- Tongue
- English
- Weight
- 910 KB
- Volume
- 54
- Category
- Article
- ISSN
- 0018-9383
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