✦ LIBER ✦
An investigation of drain pulse induced hot carrier degradation in n-type low temperature polycrystalline silicon thin film transistors
✍ Scribed by Meng Zhang; Mingxiang Wang
- Book ID
- 108210859
- Publisher
- Elsevier Science
- Year
- 2010
- Tongue
- English
- Weight
- 507 KB
- Volume
- 50
- Category
- Article
- ISSN
- 0026-2714
No coin nor oath required. For personal study only.