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On-Chip Measurement of Single-Event Transients in a 45 nm Silicon-on-Insulator Technology

✍ Scribed by Loveless, T. D.; Kauppila, J. S.; Jagannathan, S.; Ball, D. R.; Rowe, J. D.; Gaspard, N. J.; Atkinson, N. M.; Blaine, R. W.; Reece, T. R.; Ahlbin, J. R.; Haeffner, T. D.; Alles, M. L.; Holman, W. T.; Bhuva, B. L.; Massengill, L. W.

Book ID: 118064145
Publisher: IEEE
Year: 2012
Tongue: English
Weight: 940 KB
Volume: 59
Category: Article
ISSN: 0018-9499
DOI: 10.1109/tns.2012.2218257

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