Single-Event-Upset Critical Charge Measurements and Modeling of 65 nm Silicon-on-Insulator Latches and Memory Cells

✍ Scribed by Heidel, David F.; Rodbell, Kenneth P.; Oldiges, Phil; Gordon, Michael S.; Tang, Henry H. K.; Cannon, Ethan H.; Plettner, Cristina

• Book ID: 115524300
• Publisher: IEEE
• Year: 2006
• Tongue: English
• Weight: 291 KB
• Volume: 53
• Category: Article
• ISSN: 0018-9499
• DOI: 10.1109/tns.2006.886223