Low-Energy Proton-Induced Single-Event-Upsets in 65 nm Node, Silicon-on-Insulator, Latches and Memory Cells

✍ Scribed by Rodbell, Kenneth P.; Heidel, David F.; Tang, Henry H. K.; Gordon, Michael S.; Oldiges, Phil; Murray, Conal E.

• Book ID: 118127423
• Publisher: IEEE
• Year: 2007
• Tongue: English
• Weight: 337 KB
• Volume: 54
• Category: Article
• ISSN: 0018-9499
• DOI: 10.1109/tns.2007.909845