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[IEEE 2011 IEEE 29th International Conference on Computer Design (ICCD 2011) - Amherst, MA, USA (2011.10.9-2011.10.12)] 2011 IEEE 29th International Conference on Computer Design (ICCD) - Modeling and design of a nanoscale memory cell for hardening to a single event with multiple node upset

✍ Scribed by Lin, Sheng; Kim, Yong-Bin; Lombardi, Fabrizio

Book ID: 117998789
Publisher: IEEE
Year: 2011
Weight: 868 KB
Volume: 0
Category: Article
ISBN: 1457719525
DOI: 10.1109/iccd.2011.6081418

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