Evaluating the Influence of Various Body-Contacting Schemes on Single Event Transients in 45-nm SOI CMOS

✍ Scribed by Moen, Kurt A.; Phillips, Stanley D.; Wilcox, Edward P.; Cressler, John D.; Nayfeh, Hasan; Sutton, Akil K.; Warner, Jeffrey H.; Buchner, Stephen P.; McMorrow, Dale; Vizkelethy, Gyorgy; Dodd, Paul

• Book ID: 120653488
• Publisher: IEEE
• Year: 2010
• Tongue: English
• Weight: 775 KB
• Category: Article
• ISSN: 0018-9499
• DOI: 10.1109/TNS.2010.2076304