Negative Bias Temperature Instability Effect on the Single Event Transient Sensitivity of a 65 nm CMOS Technology

✍ Scribed by Moukhtari, I. El; Pouget, Vincent; Darracq, Frederic; Larue, Camille; Perdu, Philippe; Lewis, Dean

• Book ID: 121823448
• Publisher: IEEE
• Year: 2013
• Tongue: English
• Weight: 470 KB
• Volume: 60
• Category: Article
• ISSN: 0018-9499
• DOI: 10.1109/TNS.2012.2231437