✦ LIBER ✦
Supply Voltage Dependent On-Chip Single-Event Transient Pulse Shape Measurements in 90-nm Bulk CMOS Under Alpha Irradiation
✍ Scribed by Hofbauer, Michael; Schweiger, Kurt; Zimmermann, Horst; Giesen, Ulrich; Langner, Frank; Schmid, Ulrich; Steininger, Andreas
- Book ID
- 125476509
- Publisher
- IEEE
- Year
- 2013
- Tongue
- English
- Weight
- 833 KB
- Volume
- 60
- Category
- Article
- ISSN
- 0018-9499
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