✦ LIBER ✦

Modeling of hot-carrier stressed characteristics of submicrometer pMOSFETs

✍ Scribed by Sheng-Lyang Jang; Tz-Hua Tang; Young-Shying Chen; Chorng-Jye Sheu

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Modeling of hot-carrier-stressed charact

✍ Young-Shying Chen; Tz-Hua Tang; Sheng-Lyang Jang 📂 Article 📅 1996 🏛 Elsevier Science 🌐 English ⚖ 474 KB

2-D simulation of pMOSFET hot-carrier de

✍ A.v. Schwerin; W. Weber 📂 Article 📅 1995 🏛 Elsevier Science 🌐 English ⚖ 709 KB

Hot-carrier degradation of nMOSTs stress

✍ E. Simoen; C. Claeys 📂 Article 📅 1993 🏛 Elsevier Science 🌐 English ⚖ 491 KB

Hot-Carrier degradation of the Random Te

✍ E. Simoen; B. Dierickx; C. Claeys 📂 Article 📅 1993 🏛 Springer 🌐 English ⚖ 633 KB

Hot-carrier reliability characteristics

✍ Hyunsang Hwang; Jack Lee; Pierre Fazan; Chuck Dennison 📂 Article 📅 1993 🏛 Elsevier Science 🌐 English ⚖ 176 KB

Comprehensive physical modeling of nmosf

✍ M.M. Lunenborg; H.C. De Graaff; A.J. Mouthaan; J.F. Verweij Mesa 📂 Article 📅 1996 🏛 Elsevier Science 🌐 English ⚖ 260 KB