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Comprehensive physical modeling of nmosfet hot-carrier-induced degradation

✍ Scribed by M.M. Lunenborg; H.C. De Graaff; A.J. Mouthaan; J.F. Verweij Mesa

Publisher: Elsevier Science
Year: 1996
Tongue: English
Weight: 260 KB
Volume: 36
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(96)00170-9

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