✦ LIBER ✦
Hot-carrier induced series resistance enhancement model (HISREM) of nMOSFET's for circuit simulations and reliability projections
✍ Scribed by Nam Hwang; Leonard Forbes
- Publisher
- Elsevier Science
- Year
- 1995
- Tongue
- English
- Weight
- 651 KB
- Volume
- 35
- Category
- Article
- ISSN
- 0026-2714
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