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Characterization and analysis of drain-stress induced hot-carrier effects on NMOSFETs

✍ Scribed by Ker-Wen Teng; Kuan-Yu Fu

Publisher: Elsevier Science
Year: 1988
Tongue: English
Weight: 431 KB
Volume: 31
Category: Article
ISSN: 0038-1101
DOI: 10.1016/0038-1101(88)90026-3

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