✦ LIBER ✦

Modeling of hot-carrier-stressed characteristics of nMOSFETs

✍ Scribed by Young-Shying Chen; Tz-Hua Tang; Sheng-Lyang Jang

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Modeling of hot-carrier stressed charact

✍ Sheng-Lyang Jang; Tz-Hua Tang; Young-Shying Chen; Chorng-Jye Sheu 📂 Article 📅 1996 🏛 Elsevier Science 🌐 English ⚖ 628 KB

Comprehensive physical modeling of nmosf

✍ M.M. Lunenborg; H.C. De Graaff; A.J. Mouthaan; J.F. Verweij Mesa 📂 Article 📅 1996 🏛 Elsevier Science 🌐 English ⚖ 260 KB

Characterization and analysis of drain-s

✍ Ker-Wen Teng; Kuan-Yu Fu 📂 Article 📅 1988 🏛 Elsevier Science 🌐 English ⚖ 431 KB

Time dependence of hot-carrier degradati

✍ Q. Wang; W.H. Krautschneider; M. Brox; W. Weber 📂 Article 📅 1991 🏛 Elsevier Science 🌐 English ⚖ 193 KB

Hot-carrier reliability of submicron NMO

✍ Sasan Naseh; M. Jamal Deen; Chih-Hung Chen 📂 Article 📅 2006 🏛 Elsevier Science 🌐 English ⚖ 753 KB

Hot-carrier degradation of nMOSTs stress

✍ E. Simoen; C. Claeys 📂 Article 📅 1993 🏛 Elsevier Science 🌐 English ⚖ 491 KB