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Hot-carrier degradation of nMOSTs stressed at 4.2 K

✍ Scribed by E. Simoen; C. Claeys

Publisher: Elsevier Science
Year: 1993
Tongue: English
Weight: 491 KB
Volume: 36
Category: Article
ISSN: 0038-1101
DOI: 10.1016/0038-1101(93)90262-o

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