✦ LIBER ✦
Study of hot-carrier degradation in submicrometer LDD NMOSFET's from 1f noise and charge pumping current measurements at different temperature anneals
✍ Scribed by D.S. Ang; C.H. Ling; Y.T. Yeow
- Publisher
- Elsevier Science
- Year
- 1995
- Tongue
- English
- Weight
- 322 KB
- Volume
- 28
- Category
- Article
- ISSN
- 0167-9317
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