Evaluation of channel hot carrier effects in n-MOS transistors at 77 K with the charge pumping technique

✍ Scribed by P. Heremans; Y.-C. Sun; G. Groeseneken; H.E. Maes

• Publisher: Elsevier Science
• Year: 1987
• Tongue: English
• Weight: 306 KB
• Volume: 30
• Category: Article
• ISSN: 0169-4332
• DOI: 10.1016/0169-4332(87)90107-3