✦ LIBER ✦
Hot-carrier reliability of submicron NMOSFETs and integrated NMOS low noise amplifiers
✍ Scribed by Sasan Naseh; M. Jamal Deen; Chih-Hung Chen
- Publisher
- Elsevier Science
- Year
- 2006
- Tongue
- English
- Weight
- 753 KB
- Volume
- 46
- Category
- Article
- ISSN
- 0026-2714
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