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2-D simulation of pMOSFET hot-carrier degradation

✍ Scribed by A.v. Schwerin; W. Weber

Publisher: Elsevier Science
Year: 1995
Tongue: English
Weight: 709 KB
Volume: 28
Category: Article
ISSN: 0167-9317
DOI: 10.1016/0167-9317(95)00059-h

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