Reliability simulation of AC hot carrier degradation for deep sub-micron MOSFETs

✍ Scribed by Satoshi Shimizu; Motoaki Tanizawa; Shigeru Kusunoki; Masahide Inuishi; Hirokazu Miyoshi

• Publisher: John Wiley and Sons
• Year: 1996
• Tongue: English
• Weight: 702 KB
• Volume: 79
• Category: Article
• ISSN: 8756-663X
• DOI: 10.1002/ecjb.4420791103