✦ LIBER ✦

An analytical model for hot-carrier-induced degradation of deep-submicron n-channel LDD MOSFETs

✍ Scribed by Jung-Suk Goo; Young-Gwan Kim; Hyeokjae L'Yee; Ho-Yup Kwon; Hyungsoon Shin

No coin nor oath required. For personal study only.

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