Simulation of the logic switching characteristics of hot-carrier-degraded ultra-thin SOI CMOS inverters

✍ Scribed by Gwo-Chung Tai; Can E. Korman; Isaak D. Mayergoyz

• Publisher: Elsevier Science
• Year: 1996
• Tongue: English
• Weight: 427 KB
• Volume: 39
• Category: Article
• ISSN: 0038-1101
• DOI: 10.1016/0038-1101(96)00073-1