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Simulation of the logic switching characteristics of hot-carrier-degraded ultra-thin SOI CMOS inverters

โœ Scribed by Gwo-Chung Tai; Can E. Korman; Isaak D. Mayergoyz


Publisher
Elsevier Science
Year
1996
Tongue
English
Weight
427 KB
Volume
39
Category
Article
ISSN
0038-1101

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