Hot-Carrier degradation of the Random Telegraph Signal amplitude in submicrometer Si MOSTs

✍ Scribed by E. Simoen; B. Dierickx; C. Claeys

• Publisher: Springer
• Year: 1993
• Tongue: English
• Weight: 633 KB
• Volume: 57
• Category: Article
• ISSN: 1432-0630
• DOI: 10.1007/bf00332604