✦ LIBER ✦
Random telegraph signal noise: A probe for hot-carrier degradation effects in submicrometer MOSFET's?
✍ Scribed by E. Simoen; B. Dierickx; C. Claeys
- Publisher
- Elsevier Science
- Year
- 1992
- Tongue
- English
- Weight
- 263 KB
- Volume
- 19
- Category
- Article
- ISSN
- 0167-9317
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