๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Hot-carrier reliability characteristics of narrow-width MOSFETs

โœ Scribed by Hyunsang Hwang; Jack Lee; Pierre Fazan; Chuck Dennison

Publisher
Elsevier Science
Year
1993
Tongue
English
Weight
176 KB
Volume
36
Category
Article
ISSN
0038-1101

No coin nor oath required. For personal study only.

๐Ÿ“œ SIMILAR VOLUMES

Hot-carrier reliability monitoring of DM
Hot-carrier reliability monitoring of DMG ISE SON MOSFET for improved analog performance
โœ Ravneet Kaur; Rishu Chaujar; Manoj Saxena; R. S. Gupta ๐Ÿ“‚ Article ๐Ÿ“… 2010 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 204 KB

The hot-carrier reliability, analog, and linearity characteristics of DMG ISE SON MOSFET have been discussed. The device reduces electron temperature by 35.85% in comparison to a non-dual material gate (DMG) architecture showing its self-heating resistant nature. The analog performance and linearity