๐”– Bobbio Scriptorium
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A novel hot carrier reliability monitor for LDD p-MOSFETs

โœ Scribed by Y. Pan; K.K. Ng; V. Kwong

Publisher
Elsevier Science
Year
1994
Tongue
English
Weight
377 KB
Volume
37
Category
Article
ISSN
0038-1101

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Hot-carrier reliability monitoring of DM
Hot-carrier reliability monitoring of DMG ISE SON MOSFET for improved analog performance
โœ Ravneet Kaur; Rishu Chaujar; Manoj Saxena; R. S. Gupta ๐Ÿ“‚ Article ๐Ÿ“… 2010 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 204 KB

The hot-carrier reliability, analog, and linearity characteristics of DMG ISE SON MOSFET have been discussed. The device reduces electron temperature by 35.85% in comparison to a non-dual material gate (DMG) architecture showing its self-heating resistant nature. The analog performance and linearity