✦ LIBER ✦
A novel hot carrier reliability monitor for LDD p-MOSFETs : Y. Pan, K. K. Ng and W. Kwong. Solid-State Electronics, 37, 12, 1961 (1994)
- Publisher
- Elsevier Science
- Year
- 1996
- Tongue
- English
- Weight
- 111 KB
- Volume
- 36
- Category
- Article
- ISSN
- 0026-2714
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