✦ LIBER ✦
Hot-carrier reliability monitoring of DMG ISE SON MOSFET for improved analog performance
✍ Scribed by Ravneet Kaur; Rishu Chaujar; Manoj Saxena; R. S. Gupta
- Publisher
- John Wiley and Sons
- Year
- 2010
- Tongue
- English
- Weight
- 204 KB
- Volume
- 52
- Category
- Article
- ISSN
- 0895-2477
No coin nor oath required. For personal study only.
✦ Synopsis
The hot-carrier reliability, analog, and linearity characteristics of DMG ISE SON MOSFET have been discussed. The device reduces electron temperature by 35.85% in comparison to a non-dual material gate (DMG) architecture showing its self-heating resistant nature. The analog performance and linearity metrics-g m /I DS , R out , V EA , and g m /g d and VIP 2 and VIP 3 -have been studied facilitating the selection of bias point for improved RF/analog performance.