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Modeling and simulation of the lag effect in a deep reactive ion etching process

✍ Scribed by Tan, Yiyong; Zhou, Rongchun; Zhang, Haixia; Lu, Guizhang; Li, Zhihong


Book ID
120469284
Publisher
Institute of Physics
Year
2006
Tongue
English
Weight
760 KB
Volume
16
Category
Article
ISSN
0960-1317

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