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Method of diagnosing multiple stuck-at-faults in combinational circuits

✍ Scribed by Teruhiko Yamada; Shuji Hamada; Tatsuo Matsumoto; Toshihiko Takahashi; Takao Nakayama

Publisher: John Wiley and Sons
Year: 1991
Tongue: English
Weight: 674 KB
Volume: 22
Category: Article
ISSN: 0882-1666
DOI: 10.1002/scj.4690221103

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